pco.edge 1.3 SWIR CLHS Camera

pco.edge 1.3 SWIR CLHS Camera

The pco.edge 1.3 SWIR CLHS scientific InGaAs camera is designed to deliver exceptional imaging performance across visible and short-wave infrared (SWIR) wavelengths. Developed for demanding scientific and industrial imaging applications, the camera combines ultra-low readout noise of < 25 e-(rms) with high quantum efficiency and deep sensor cooling. It features a 1280 x 1024 InGaAs image sensor with 10 µm x 10 µm pixels, frame rates of up to 148 fps and broad spectral sensitivity ranging from 300 nm to 1700 nm.

The pco.edge 1.3 SWIR combines low readout noise, high quantum efficiency and broad spectral sensitivity from VIS to SWIR in a compact scientific camera platform. These combined capabilities enable highly sensitive imaging and low-noise measurements.

InterfaceCLHS
Sensor technologyInGaAs
Color typeMonochrome
Resolution1280 x 1024 pixels
Sensor diagonal16.4 mm
Pixel size10.0 µm x 10.0 µm
Maximum frame rate @ full resolution148 fps
Peak QE73 % @ 1250 nm
Typical readout noise25 e- rms
Dark current @ sensor temperature245 e-/pixel/s @ -20 °C
Maximum dynamic range1 : 4200 (70 dB)
Shutter typeGlobal shutter
Sensor coolingForced air
Dimensions (H x W x L)98 mm x 98 mm x 161 mm

  • Intravital and in-vivo microscopy

  • In-vivo microscopy

  • Fluorescence microscopy

  • Light-sheet fluorescence microscopy (LSFM/SPIM)

  • Structured illumination microscopy (SIM)

  • Digital surgery microscopy systems

  • Hyperspectral imaging

  • Semiconductor inspection

  • Packaging inspection

  • Waste classification

InterfaceCLHS
Sensor technologyInGaAs
Color typeMonochrome
Resolution1280 x 1024 pixels
Sensor diagonal16.4 mm
Pixel size10.0 µm x 10.0 µm
Maximum frame rate @ full resolution148 fps
Peak QE73 % @ 1250 nm
Typical readout noise25 e- rms
Dark current @ sensor temperature245 e-/pixel/s @ -20 °C
Maximum dynamic range1 : 4200 (70 dB)
Shutter typeGlobal shutter
Sensor coolingForced air
Dimensions (H x W x L)98 mm x 98 mm x 161 mm

  • Intravital and in-vivo microscopy

  • In-vivo microscopy

  • Fluorescence microscopy

  • Light-sheet fluorescence microscopy (LSFM/SPIM)

  • Structured illumination microscopy (SIM)

  • Digital surgery microscopy systems

  • Hyperspectral imaging

  • Semiconductor inspection

  • Packaging inspection

  • Waste classification

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