pco.edge 5.5 CLHS
PART/ 85108072201

pco.edge 5.5 CLHS sCMOS Camera

The pco.edge 5.5 is a high resolution cooled sCMOS camera utilizing a CLHS interface and 10G FOL (Camera Link HS) to allow direct processing of large data transfers via a computer making it easy to securely bridge distances of up to 10 km. This camera is equipped with a 16-bit scientific CMOS sensor for capturing crisp images and precise measurements. The pco.edge 5.5 camera also comes with an option to upgrade with a water cooling system.

Sensor Technology sCMOS FSI
Resolution (H x V) 2560 x 2160
Pixel Size (H x V) 6.5 x 6.5
Sensor Diagonal 21.8 mm
Peak Quantum Efficiency 60.0 %
Peak Quantum Efficiency Wavelength 600.0 nm
Global Shutter true
Rolling Shutter true
Global Reset true
Operational Modes Slow Scan: Rolling Shutter
Slow Scan: Global Reset
Fast Scan: Rolling Shutter
Fast Scan: Global Reset
Fast Scan: Global Shutter
Readout Noise RMS 1.4 e-
1.4 e-
1.5 e-
1.5 e-
2.5 e-
Readout Noise Median 1.0 e-
1.0 e-
1.1 e-
1.1 e-
2.2 e-
Fullwell Capacity 30000 e-
Dynamic Range 30000:1
30000:1
27000:1
27000:1
13500:1
Dynamic Range (log) 90.0 dB
90.0 dB
89.0 dB
89.0 dB
83.0 dB
Dark Current 0.6 e-/s
0.6 e-/s
0.6 e-/s
0.6 e-/s
0.9 e-/s
Sensor Temperature (Dark Current Reference) 7.0 °C
Frame rate (Full Sensor) 33.0 fps
33.0 fps
100.0 fps
100.0 fps
50.0 fps
Dynamic Range A/D Converter 16 bit
Thermo Electric Cooling true
Forced Air true
Liquid Cooling false
Data Interface Camera Link HS FOL
Included Lens Mount C-Mount
F-Mount
Width 70.0 mm
Length 123.0 mm
Weight (kg) 0.8
Height 76.0 mm
Part Number 85108072201
  • Bright-field microscopy
  • Fluorescence microscopy
  • Digital pathology
  • Single molecule localization microscopy (SMLM) – PALM, STORM, dSTORM, GSDIM
  • Lightsheet fluorescence microscopy (LSFM)
  • Structured illumination microscopy (SIM)
  • Calcium imaging
  • Förster resonance energy transfer (FRET)
  • Fluorescence recovery after photobleaching (FRAP)
  • High-speed bright-field ratio imaging
  • High throughput screening
  • High content screening
  • Biochip reading
  • Total internal reflection microscopy (TITF)
  • Spinning disk confocal microscopy
  • 3D metrology
  • Ophthalmology
  • Photovoltaic inspection
  • Industrial quality inspection
  • Wafer inspection
  • Image intensifier imaging
  • Lucky astronomy
  • Disaster recovery
  • Tunnel inspection
  • Particle tracking velocimetry (PTV)
Sensor Technology sCMOS FSI
Resolution (H x V) 2560 x 2160
Pixel Size (H x V) 6.5 x 6.5
Sensor Diagonal 21.8 mm
Peak Quantum Efficiency 60.0 %
Peak Quantum Efficiency Wavelength 600.0 nm
Global Shutter true
Rolling Shutter true
Global Reset true
Operational Modes Slow Scan: Rolling Shutter
Slow Scan: Global Reset
Fast Scan: Rolling Shutter
Fast Scan: Global Reset
Fast Scan: Global Shutter
Readout Noise RMS 1.4 e-
1.4 e-
1.5 e-
1.5 e-
2.5 e-
Readout Noise Median 1.0 e-
1.0 e-
1.1 e-
1.1 e-
2.2 e-
Fullwell Capacity 30000 e-
Dynamic Range 30000:1
30000:1
27000:1
27000:1
13500:1
Dynamic Range (log) 90.0 dB
90.0 dB
89.0 dB
89.0 dB
83.0 dB
Dark Current 0.6 e-/s
0.6 e-/s
0.6 e-/s
0.6 e-/s
0.9 e-/s
Sensor Temperature (Dark Current Reference) 7.0 °C
Frame rate (Full Sensor) 33.0 fps
33.0 fps
100.0 fps
100.0 fps
50.0 fps
Dynamic Range A/D Converter 16 bit
Thermo Electric Cooling true
Forced Air true
Liquid Cooling false
Data Interface Camera Link HS FOL
Included Lens Mount C-Mount
F-Mount
Width 70.0 mm
Length 123.0 mm
Weight (kg) 0.8
Height 76.0 mm
Part Number 85108072201
  • Bright-field microscopy
  • Fluorescence microscopy
  • Digital pathology
  • Single molecule localization microscopy (SMLM) – PALM, STORM, dSTORM, GSDIM
  • Lightsheet fluorescence microscopy (LSFM)
  • Structured illumination microscopy (SIM)
  • Calcium imaging
  • Förster resonance energy transfer (FRET)
  • Fluorescence recovery after photobleaching (FRAP)
  • High-speed bright-field ratio imaging
  • High throughput screening
  • High content screening
  • Biochip reading
  • Total internal reflection microscopy (TITF)
  • Spinning disk confocal microscopy
  • 3D metrology
  • Ophthalmology
  • Photovoltaic inspection
  • Industrial quality inspection
  • Wafer inspection
  • Image intensifier imaging
  • Lucky astronomy
  • Disaster recovery
  • Tunnel inspection
  • Particle tracking velocimetry (PTV)
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