PART/ 85108072401
pco.edge 5.5 USB sCMOS Camera
The pco.edge 5.5 USB camera is equipped with a well-established scientific CMOS (sCMOS) sensor that provides crisp images and precise measurements. The pco.edge 5.5 sCMOS camera features an option to upgrade with a water-cooling system and is ideally suited for applications that require high resolution, high frame rates, best 16-bit dynamic range, selectable shutter variants and an optional color sensor.
| Sensor Technology | sCMOS FSI |
| Resolution (H x V) | 2560 x 2160 |
| Pixel Size (H x V) | 6.5 x 6.5 |
| Sensor Diagonal | 21.8 mm |
| Peak Quantum Efficiency | 60.0 % |
| Peak Quantum Efficiency Wavelength | 600.0 nm |
| Global Shutter | true |
| Rolling Shutter | true |
| Global Reset | true |
| Operational Modes |
Rolling Shutter with Selectable Readout Direction Global Reset Global Shutter |
| Readout Noise RMS |
1.4 e- 1.4 e- 2.6 e- |
| Readout Noise Median |
1.0 e- 1.0 e- 2.3 e- |
| Fullwell Capacity | 30000 e- |
| Dynamic Range |
30000:1 30000:1 13000:1 |
| Dynamic Range (log) |
90.0 dB 90.0 dB 82.0 dB |
| Dark Current |
0.5 e-/s 0.5 e-/s 0.8 e-/s |
| Sensor Temperature (Dark Current Reference) | 5.0 °C |
| Frame rate (Full Sensor) |
30.0 fps 30.0 fps 28.0 fps |
| Dynamic Range A/D Converter | 16 bit |
| Thermo Electric Cooling | true |
| Forced Air | true |
| Liquid Cooling | true |
| Working Temperature Image Sensor | +5 °C stabilized (up to +27 °C ambient temperature) |
| Data Interface | USB 3.0 |
| Included Lens Mount |
C-Mount F-Mount |
| Width | 70.0 mm |
| Length | 100.0 mm |
| Weight (kg) | 0.75 |
| Height | 76.0 mm |
| Part Number | 85108072401 |
- Bright-field microscopy
- Fluorescence microscopy
- Digital pathology
- Single molecule localization microscopy (SMLM) – PALM, STORM, dSTORM, GSDIM
- Lightsheet fluorescence microscopy (LSFM)
- Structured illumination microscopy (SIM)
- Calcium imaging
- Förster resonance energy transfer (FRET)
- Fluorescence recovery after photobleaching (FRAP)
- High-speed bright-field ratio imaging
- High throughput screening
- High content screening
- Biochip reading
- Total internal reflection microscopy (TITF)
- Spinning disk confocal microscopy
- 3D metrology
- Ophthalmology
- Photovoltaic inspection
- Industrial quality inspection
- Wafer inspection
- Image intensifier imaging
- Lucky astronomy
- Disaster recovery
- Tunnel inspection
- Particle tracking velocimetry (PTV)




| Sensor Technology | sCMOS FSI |
| Resolution (H x V) | 2560 x 2160 |
| Pixel Size (H x V) | 6.5 x 6.5 |
| Sensor Diagonal | 21.8 mm |
| Peak Quantum Efficiency | 60.0 % |
| Peak Quantum Efficiency Wavelength | 600.0 nm |
| Global Shutter | true |
| Rolling Shutter | true |
| Global Reset | true |
| Operational Modes |
Rolling Shutter with Selectable Readout Direction Global Reset Global Shutter |
| Readout Noise RMS |
1.4 e- 1.4 e- 2.6 e- |
| Readout Noise Median |
1.0 e- 1.0 e- 2.3 e- |
| Fullwell Capacity | 30000 e- |
| Dynamic Range |
30000:1 30000:1 13000:1 |
| Dynamic Range (log) |
90.0 dB 90.0 dB 82.0 dB |
| Dark Current |
0.5 e-/s 0.5 e-/s 0.8 e-/s |
| Sensor Temperature (Dark Current Reference) | 5.0 °C |
| Frame rate (Full Sensor) |
30.0 fps 30.0 fps 28.0 fps |
| Dynamic Range A/D Converter | 16 bit |
| Thermo Electric Cooling | true |
| Forced Air | true |
| Liquid Cooling | true |
| Working Temperature Image Sensor | +5 °C stabilized (up to +27 °C ambient temperature) |
| Data Interface | USB 3.0 |
| Included Lens Mount |
C-Mount F-Mount |
| Width | 70.0 mm |
| Length | 100.0 mm |
| Weight (kg) | 0.75 |
| Height | 76.0 mm |
| Part Number | 85108072401 |
- Bright-field microscopy
- Fluorescence microscopy
- Digital pathology
- Single molecule localization microscopy (SMLM) – PALM, STORM, dSTORM, GSDIM
- Lightsheet fluorescence microscopy (LSFM)
- Structured illumination microscopy (SIM)
- Calcium imaging
- Förster resonance energy transfer (FRET)
- Fluorescence recovery after photobleaching (FRAP)
- High-speed bright-field ratio imaging
- High throughput screening
- High content screening
- Biochip reading
- Total internal reflection microscopy (TITF)
- Spinning disk confocal microscopy
- 3D metrology
- Ophthalmology
- Photovoltaic inspection
- Industrial quality inspection
- Wafer inspection
- Image intensifier imaging
- Lucky astronomy
- Disaster recovery
- Tunnel inspection
- Particle tracking velocimetry (PTV)




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